Patrick J. Flynn is the Duda Family Professor of Engineering, Professor of Computer Science & Engineering, and Concurrent Professor of Electrical Engineering at the University of Notre Dame.  For the 2016-2017 academic year, he is serving as Provost's Fellow and Interim Director of Notre Dame California, the University's array of academic, research, student service, and outreach activities in the Golden State.

Pat received the B.S. in Electrical Engineering (1985), the M.S. in Computer Science (1986), and the Ph.D. in Computer Science (1990) from Michigan State University, East Lansing. He has held faculty positions at Notre Dame (1990-1991, 2001-present), Washington State University (1991-1998), and The Ohio State University (1998-2001). In 2007-2008, he held a visiting scientist appointment at the National Institute of Standards and Technology during a sabbatical leave.

Dr. Flynn's research interests include computer vision, biometrics, and image processing, and he has advised or co-advised eighteen Ph.D. dissertations, six postdoctoral scholarships, twenty-two M.S. theses, and two B.S. theses.  Dr. Flynn is an IEEE Fellow, an IAPR Fellow, and an ACM Distinguished Scientist. He is the Editor-in-Chief of the IEEE Biometrics Compendium, and is a past Associate Editor-in-Chief ofIEEE Transactions on Pattern Analysis and Machine Intelligence, and a past Associate Editor of IEEE Transactions on Information Forensics and Security, IEEE Transactions on Image Processing, IEEE Transactions on Pattern Analysis and Machine Intelligence, Pattern Recognition, and Pattern Recognition Letters. He has received outstanding teaching awards from Washington State University and the University of Notre Dame, and Meritorious Service, Golden Core, and Certificate of Achievement awards from the IEEE Computer Society.